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Tag Archives: AFM

Is This the Future of AOI?

Posted on January 14, 2016 by Mike

Engineers at MIT have designed an atomic force microscope that scans images 2,000 times faster than existing commercial models. With this new high-speed instrument, the team produced images of chemical processes taking place at the nano-scale at the rate close to real-time video.

Posted in Hot Wires | Tagged AFM, atomic force microscope, camera, electron, MIT, optical

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