In our last post, we discussed techniques to mitigate tin whiskers (TW). To help determine what your tin whisker mitigation strategy should be, consider using failure modes and effects analysis (FMEA). The central metric of FMEA is the risk priority number (RPN). For tin whiskers, the RPN is equal to the product of: (1) the probability of tin whiskers (P); (2) the severity, if a tin whisker exists (S); and (3) how hard it is to detect a tin whisker (D). In equation form:

RPN = P*S*D

As a first example, consider a consumer product, like a mobile phone with a life of 5 years. With mitigation, on a scale of 1 to 10, P might be 2. For S, we might rate it at a 3, as a failure in the device is unlikely to cause severe harm to anyone. Detection (D) is a problem because the tin whiskers that form later cannot be detected during manufacturing; hence, we would have to rate D as a 10. So, the RPN is: 2*3*10 = 60, which is not too high. Therefore, with P and S at relatively low values, a tin whisker mitigation strategy would likely be successful for any consumer product. It should be pointed out that determining the RPN numbers would almost certainly require supporting data, brainstorming sessions, and a buy-in from the entire product team. The team would also have to determine any appropriate mitigation strategy such as avoiding bright tin coatings on component leads and perhaps using a flash of nickel between the copper and the tin (Figure 1).

Figure 1. In mission-critical products, coatings may be required. It is almost impossible for a TW to penetrate both layers of coating as shown above.

Now consider a mission-critical product, such as certain types of military equipment. If we assume that the electronics have a service life of 40 years and that a failure could cause bodily harm or death, we could likely end up with a consensus that RPN = 10*10*10 =1000, the highest RPN possible. This situation would demand that special tactics be used to address the tin whisker risk. These tactics were discussed in my paper and presentation given at **SMTA Pan Pacific 2019**.

Cheers,

Dr. Ron